A hard x-ray micro-analytical beamline at the CAMD synchrotron

Conference · Sat Jul 01 00:00:00 EDT 1995

OSTI ID:82179

Petri, M C; Leibowitz, L ^[1]; Schilling, P ^[2]

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1. Argonne National Lab., IL (United States)
2. Louisiana State Univ., Baton Rouge, LA (United States). Center for Advanced Microstructures and Devices

Argonne National Laboratory (ANL) is collaborating with Louisiana State University (LSU) in constructing a synchrotron x-ray micro-analytical beamline at the Center for Advanced Microstructures and Devices (CAMD) in Baton Rouge. This project grew from earlier work at the National Synchrotron Light Source (NSLS), where a team of ANL researchers developed techniques to examine small-scale structures in diffusion zones of a variety of materials. The ANL/CAMD beamline will use x-ray fluorescence, diffraction, and absorption spectroscopy techniques to reveal both compositional and structural information on a microscopic scale.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 82179
• Report Number(s): ANL/ED/CP-86766; CONF-950793-2; ON: DE95014232
• Resource Relation: Conference: 40. annual meeting of the Society of Photo-Optical Instrumentation Engineers, San Diego, CA (United States), 9-14 Jul 1995; Other Information: PBD: [1995]
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
66 PHYSICS
SYNCHROTRON RADIATION SOURCES
USES
SYNCHROTRONS
X-RAY DIFFRACTION
SCANNING ELECTRON MICROSCOPY
SYNCHROTRON RADIATION
X-RAY FLUORESCENCE ANALYSIS
FLUORESCENCE SPECTROSCOPY
ABSORPTION SPECTROSCOPY