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Title: Development of a second generation scanning photoemission microscope with a zone plate generated microprobe at the National Synchrotron Light Source

Journal Article · · Review of Scientific Instruments; (United States)
DOI:https://doi.org/10.1063/1.1145926· OSTI ID:6599730
;  [1];  [2]; ;  [3];  [4]
  1. Department of Physics, State University of New York, Stony Brook, New York 11794 (United States)
  2. Department of Physics, North Carolina State University, Raleigh, North Carolina 27695 (United States)
  3. National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973 (United States)
  4. Center for X-ray Optics, Lawrence Berkeley Laboratory, California 94720 (United States)

We have been developing an instrument that combines the techniques of x-ray photoelectron spectroscopy and zone plate microfocusing to perform spectromicroscopy. The X1A undulator provides a bright photon source in the soft x-ray range with a high degree of spatial coherence (a requirement for zone plate focusing). A spherical grating monochromator selects the desired photon energy in the 280--800 eV range. A Fresnel zone plate focuses the beam to a small spot. Photoelectron spectra can be acquired from the small irradiated area with an electron energy analyzer. With the beam focused on the surface and the sample mechanically scanned, element-specific or chemical-state-specific images of the surface can be obtained.

DOE Contract Number:
AC02-76CH00016; AC03-76SF00098
OSTI ID:
6599730
Journal Information:
Review of Scientific Instruments; (United States), Vol. 66:2; ISSN 0034-6748
Country of Publication:
United States
Language:
English