Development of a second generation scanning photoemission microscope with a zone plate generated microprobe at the National Synchrotron Light Source
- Department of Physics, State University of New York, Stony Brook, New York 11794 (United States)
- Department of Physics, North Carolina State University, Raleigh, North Carolina 27695 (United States)
- National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973 (United States)
- Center for X-ray Optics, Lawrence Berkeley Laboratory, California 94720 (United States)
We have been developing an instrument that combines the techniques of x-ray photoelectron spectroscopy and zone plate microfocusing to perform spectromicroscopy. The X1A undulator provides a bright photon source in the soft x-ray range with a high degree of spatial coherence (a requirement for zone plate focusing). A spherical grating monochromator selects the desired photon energy in the 280--800 eV range. A Fresnel zone plate focuses the beam to a small spot. Photoelectron spectra can be acquired from the small irradiated area with an electron energy analyzer. With the beam focused on the surface and the sample mechanically scanned, element-specific or chemical-state-specific images of the surface can be obtained.
- DOE Contract Number:
- AC02-76CH00016; AC03-76SF00098
- OSTI ID:
- 6599730
- Journal Information:
- Review of Scientific Instruments; (United States), Vol. 66:2; ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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A scanning photoelectron microscope (SPEM) at the National Synchrotron Light Source (NSLS)
Related Subjects
MICROSCOPES
PHOTOEMISSION
NSLS
FOCUSING
MONOCHROMATORS
ONDULATOR RADIATION
PROBES
SOFT X RADIATION
ACCELERATORS
BREMSSTRAHLUNG
CYCLIC ACCELERATORS
ELECTROMAGNETIC RADIATION
EMISSION
IONIZING RADIATIONS
RADIATION SOURCES
RADIATIONS
SECONDARY EMISSION
SYNCHROTRON RADIATION SOURCES
SYNCHROTRONS
X RADIATION
430303* - Particle Accelerators- Experimental Facilities & Equipment