High resolution time interval meter

Patent · Fri May 09 00:00:00 EDT 1986

OSTI ID:6535960

Martin, A D

Method and apparatus are provided for measuring the time interval between two events to a higher resolution than reliability available from conventional circuits and component. An internal clock pulse is provided at a frequency compatible with conventional component operating frequencies for reliable operation. Lumped constant delay circuits are provided for generating outputs at delay intervals corresponding to the desired high resolution. An initiation START pulse is input to generate first high resolution data. A termination STOP pulse is input to generate second high resolution data. Internal counters count at the low frequency internal clock pulse rate between the START and STOP pulses. The first and second high resolution data are logically combined to directly provide high resolution data to one counter and correct the count in the low resolution counter to obtain a high resolution time interval measurement.

• Research Organization: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
• DOE Contract Number: W-7405-ENG-36
• Assignee: Dept. of Energy
• Application Number: ON: DE87007246
• OSTI ID: 6535960
• Resource Relation: Other Information: Portions of this document are illegible in microfiche products
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
TIME INTERVAL ANALYZERS
TIME RESOLUTION
TIMING CIRCUITS
COUNTING CIRCUITS
DELAY CIRCUITS
FLIP-FLOP CIRCUITS
GATING CIRCUITS
GHZ RANGE
INTEGRATED CIRCUITS
TIME MEASUREMENT
ELECTRONIC CIRCUITS
FREQUENCY RANGE
MEASURING INSTRUMENTS
MICROELECTRONIC CIRCUITS
MULTIVIBRATORS
PULSE CIRCUITS
RESOLUTION
TIMING PROPERTIES
420800* - Engineering- Electronic Circuits & Devices- (-1989)