Atom probe field ion microscopy and related topics: A bibliography 1990

Technical Report · Sun Dec 01 00:00:00 EST 1991

DOI:https://doi.org/10.2172/6065426· OSTI ID:6065426

Russell, K F; Miller, M K

This bibliography includes references related to the following topics: atom probe field ion microscopy (APFIM), field ion microscopy (FIM), field emission (FE), ion sources, and field desorption mass microscopy (FDMM). Technique-orientated studies and applications are included. The bibliography covers the period 1990. The references contained in this document were compiled from a variety of sources including computer searches and personal lists of publications. To reduce the length of this document, the references have been reduced to the minimum necessary to locate the articles. The references, listed alphabetically by authors, are subdivided into the categories listed in paragraph one above. An Addendum of references missed in previous bibliographies is included.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: USDOE; USDOE, Washington, DC (United States)
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 6065426
• Report Number(s): ORNL/TM-12005; ON: DE92005518
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
ION MICROSCOPY
BIBLIOGRAPHIES
FIELD EMISSION
ION SOURCES
ORNL
DOCUMENT TYPES
EMISSION
MICROSCOPY
NATIONAL ORGANIZATIONS
US AEC
US DOE
US ERDA
US ORGANIZATIONS
440800* - Miscellaneous Instrumentation- (1990-)