Atom probe field-ion microscopy and related topics: A bibliography, 1988

Technical Report · Sun Oct 01 00:00:00 EDT 1989

DOI:https://doi.org/10.2172/5370263· OSTI ID:5370263

Miller, M. K.; Hawkins, A. R.

This bibliography includes references related to the following topics: field-ion microscopy (FIM), field emission microscopy (FEM), atom probe field-ion microscopy (APFIM), and liquid metal ion sources (LMIS). Technique-orientated studies and applications are included. The references contained in this document were compiled from a variety of sources including computer searches and personal lists of publications. To reduce the length of this document, the references have been reduced to the minimum necessary to locate the articles.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: DOE/ER
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 5370263
• Report Number(s): ORNL/TM-11370; ON: DE90004388; TRN: 90-000618
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
MICROSCOPY
BIBLIOGRAPHIES
FIELD EMISSION
ION MICROSCOPY
PROBES
DOCUMENT TYPES
EMISSION
400102* - Chemical & Spectral Procedures