Stability of multilayers at high temperatures

Conference · Wed Jan 01 00:00:00 EST 1986

OSTI ID:5821877

Ziegler, E; Lepetre, Y; Schuller, I K; Spiller, E

The temperature stability of metal (W, WRe, Co, Cr)-carbon multilayers has been studied using x-ray diffraction (theta-2theta and Debye-Scherrer) and electron microscopy. Results show that in all cases a crystallization occurs in the temperature range 650 to 750/sup 0/C. As a consequence of this crystallization, the layered structure is destroyed, the surface of the film becomes rough and the x-ray reflectivity is considerably reduced. These results imply that efficient cooling or new multilayer structures will have to be developed for use at high temperatures or under high x-ray incident flux.

• Research Organization: Argonne National Lab., IL (USA); International Business Machines Corp., Yorktown Heights, NY (USA). Thomas J. Watson Research Center
• DOE Contract Number: W-31-109-ENG-38
• OSTI ID: 5821877
• Report Number(s): CONF-860366-7; ON: DE86010526
• Resource Relation: Conference: SPIE technical symposium on applications of artificial intelligence, Orlando, FL, USA, 31 Mar 1986; Other Information: Portions of this document are illegible in microfiche products
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
COBALT
STABILITY
RHENIUM ALLOYS
TUNGSTEN
TUNGSTEN ALLOYS
BRAGG REFLECTION
CARBON
CRYSTALLIZATION
DEBYE-SCHERRER METHOD
HIGH TEMPERATURE
LAYERS
TRANSMISSION ELECTRON MICROSCOPY
VERY HIGH TEMPERATURE
X-RAY DIFFRACTION
ALLOYS
COHERENT SCATTERING
DIFFRACTION
DIFFRACTION METHODS
ELECTRON MICROSCOPY
ELEMENTS
METALS
MICROSCOPY
NONMETALS
PHASE TRANSFORMATIONS
REFLECTION
SCATTERING
TRANSITION ELEMENTS
360102* - Metals & Alloys- Structure & Phase Studies