Stability of multilayers for short-wavelength optics

Conference · Wed Sep 10 00:00:00 EDT 1986 · AIP Conf. Proc.; (United States)

OSTI ID:5257022

Ziegler, E; Lepetre, Y; Schuller, I K; Viccaro, J; Spiller, E

A variety of multilayer mirrors with transition metal absorber layers (W-C, WRe-C, CO-C, and Cr-C) have been fabricated and tested up to 1000 C using standard theta-2 theta x-ray diffraction, Debye-Scherrer scattering and microcleavage transmission electron microscopy.

• Research Organization: Argonne National Laboratory, Materials Science and Technology Division, Argonne, Illinois 60439
• DOE Contract Number: W-31-109-ENG-38
• OSTI ID: 5257022
• Report Number(s): CONF-860316-
• Journal Information: AIP Conf. Proc.; (United States), Vol. 147:1; Conference: Topical meeting on short wave length coherent radiation, Monterey, CA, USA, 24 Mar 1986
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
CHROMIUM
COATINGS
MIRRORS
MATERIALS TESTING
THERMAL STRESSES
X-RAY DIFFRACTION
OPTICAL EQUIPMENT
EXTREME ULTRAVIOLET RADIATION
X-RAY EQUIPMENT
ANNEALING
CARBON
COBALT
ELECTRON MICROSCOPY
FABRICATION
HIGH TEMPERATURE
RHENIUM
ROUGHNESS
STABILITY
TUNGSTEN
COHERENT SCATTERING
DIFFRACTION
ELECTROMAGNETIC RADIATION
ELEMENTS
EQUIPMENT
HEAT TREATMENTS
METALS
MICROSCOPY
NONMETALS
RADIATIONS
SCATTERING
STRESSES
SURFACE PROPERTIES
TESTING
TRANSITION ELEMENTS
ULTRAVIOLET RADIATION
440300* - Miscellaneous Instruments- (-1989)