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Title: Resonant laser ablation: Mechanisms and applications

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.52183· OSTI ID:542093
 [1];  [2]; ; ;  [1];  [2];  [3]
  1. Chemical Sciences and Technology, MS J565, LANL, Los Alamos, New Mexico 87545 (505) 665-7279, FAX (505)665-4631
  2. Department of Chemistry, University of California, Davis, California 95616 (United States)
  3. Chemical Sciences and Technology, MS J565, LANL, Los Alamos, New Mexico 87545 (505) 665-7279, FAX (505)665-4631 nogar (at) lanl.gov

We will report on aspects of resonant laser ablation (RLA) behavior for a number of sample types: metals, alloys, thin films, zeolites and soil. The versatility of RLA is demonstrated, with results on a variety of samples and in several mass spectrometers. In addition, the application to depth profiling of thin films is described; absolute removal rates and detection limits are also displayed. A discussion of possible mechanisms for low-power ablation are presented. {copyright} {ital 1997 American Institute of Physics.}

Sponsoring Organization:
USDOE
OSTI ID:
542093
Report Number(s):
CONF-960686-; ISSN 0094-243X; TRN: 97:019704
Journal Information:
AIP Conference Proceedings, Vol. 388, Issue 1; Conference: 8. international symposium on resonance ionization spectroscopy and its applications (RIS-96), State College, PA (United States), 30 Jun - 5 Jul 1996; Other Information: PBD: Jan 1997
Country of Publication:
United States
Language:
English

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