Resonant laser ablation: Mechanisms and applications

Journal Article · Wed Jan 15 00:00:00 EST 1997 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.52183· OSTI ID:21165670

Anderson, J E; Allen, T M; Garrett, A W; Gill, C G; Hemberger, P H; Kelly, P B; Nogar, N S ^[1]

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1. Chemical Sciences and Technology, MS J565, LANL, Los Alamos, New Mexico 87545 [phone], FAX [phone] (United States)

We will report on aspects of resonant laser ablation (RLA) behavior for a number of sample types: metals, alloys, thin films, zeolites and soil. The versatility of RLA is demonstrated, with results on a variety of samples and in several mass spectrometers. In addition, the application to depth profiling of thin films is described; absolute removal rates and detection limits are also displayed. A discussion of possible mechanisms for low-power ablation are presented.

• OSTI ID: 21165670
• Journal Information: AIP Conference Proceedings, Vol. 388, Issue 1; Conference: 8. international symposium on resonance ionization spectroscopy, State College, PA (United States), 30 Jun - 5 Jul 1996; Other Information: DOI: 10.1063/1.52183; (c) 1997 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABLATION
ALLOYS
LASER RADIATION
METALS
QUANTITATIVE CHEMICAL ANALYSIS
RESONANCE IONIZATION MASS SPECTROSCOPY
SENSITIVITY
SOILS
THIN FILMS
ZEOLITES