Theoretical considerations in the design of multilayer x-ray optics
Conference
·
OSTI ID:5408178
There is increasing interest in the application of multilayers to figured x-ray optics. Two concepts in design appraoch are presented. The requirements for image formation with a multilayer device are discussed. A geometrical approach is used. The possible affect of multilayers on image quality is studied. Models for the reflectivity of x rays by multilayers are compared briefly. 18 refs., 3 figs.
- Research Organization:
- Brigham Young Univ., Provo, UT (USA)
- DOE Contract Number:
- AS08-84DP40199
- OSTI ID:
- 5408178
- Report Number(s):
- CONF-860880-15; ON: DE86013307
- Resource Relation:
- Conference: 30. SPIE technical symposium on optics and optoelectronic engineering, San Diego, CA, USA, 17 Aug 1986; Other Information: Portions of this document are illegible in microfiche products
- Country of Publication:
- United States
- Language:
- English
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