Higher order parametric x-ray spectra in mosaic graphite and single silicon crystals

Conference · Fri Dec 31 00:00:00 EST 1993

OSTI ID:245618

Fiorito, R B; Rule, D W ^[1]; Maruyama, X K ^[2]

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1. Naval Surface Warfare Center, Silver Spring, MD (United States). Research and Tech. Dept.
2. Naval Postgraduate School, Monterey, CA (United States). Dept. of Physics; and others

We have observed up to eight orders (n) in the spectra of parametric x-radiation, in the range 5-40 keV, produced by interaction of a 90-MeV electron beam with mosaic graphite and 90 and 35 MeV beams with single Si crystals, Measured yields and intensity ratios, I(n{ge}2)/I(n=1), in graphite are not in agreement with PXR theory for mosaic crystals. In comparison, yield and ratios of intensities in Si are close to preductions for perfect crystals. Bandwidths of spectral lines measured in both Si and graphite are in good agreement with theory and are determined by the angular field of view of the detector.

• Research Organization: Adelphi Technology, Inc., Palo Alto, CA (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States); Defense Nuclear Agency, Washington, DC (United States); Department of Defense, Washington, DC (United States)
• DOE Contract Number: FG03-91ER81099
• OSTI ID: 245618
• Report Number(s): CONF-9309233-2; ON: DE96011437
• Resource Relation: Conference: International symposium on radiation of relativistic electrons in periodical structures, Tomsk (Russian Federation), 6-10 Sep 1993; Other Information: PBD: [1993]
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
66 PHYSICS
GRAPHITE
X-RAY SPECTRA
SILICON
X-RAY SOURCES
ELECTRON BEAMS