200 MeV Ag{sup 15+} ion beam irradiation effects on spray deposited 5 wt% 'Li' doped V{sub 2}O{sub 5} thin film

Journal Article · Mon May 23 00:00:00 EDT 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4947946· OSTI ID:22608717

Mohan, R. ^[1]; Manimuthu, P.; Venkateswaran, C. ^[2]; Sendilkumar, A. ^[3]; Asokan, K. ^[4]

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1. Department of Physics, Presidency College, Chennai – 600005 (India)
2. Department of Nuclear Physics, University of Madras, Guindy Campus, Chennai – 600025 (India)
3. School of Physics, University of Hyderabad, Hyderabad, Telangana State - 500046 (India)
4. Inter-University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi, 110 067 (India)

Lithium 5 wt% doped V{sub 2}O{sub 5} thin film was deposited onto ITO substrate by spray pyrolysis technique. The substrate temperature was kept at 450 °C. 200 MeV Ag{sup 15+} ion beams at a fluence of 5×10{sup 12} ions/cm{sup 2} was irradiated on 5 wt% ‘Li’ doped V{sub 2}O{sub 5} film of thickness 1367 nm. The XRD pattern confirms that the pristine film is non stoichiometry with orthorhombic structure and upon irradiation the crystallinity decreased and an obvious textured growth along (020) plane is induced. Raman peak observed at 917 cm{sup −1} is due to oxygen deficiency. Upon irradiation, the optical transparency and band gap of the film decreased. Electrical transport property study shows that the resistivity increased by one order for the irradiated film.

• OSTI ID: 22608717
• Journal Information: AIP Conference Proceedings, Vol. 1731, Issue 1; Conference: DAE solid state physics symposium 2015, Uttar Pradesh (India), 21-25 Dec 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
DOPED MATERIALS
ION BEAMS
IRRADIATION
LITHIUM ADDITIONS
MEV RANGE 100-1000
MULTICHARGED IONS
OPACITY
ORTHORHOMBIC LATTICES
PHYSICAL RADIATION EFFECTS
PYROLYSIS
SILVER 115
SPRAYS
STOICHIOMETRY
SUBSTRATES
TEXTURE
THICKNESS
THIN FILMS
VANADIUM OXIDES
X-RAY DIFFRACTION
HYSICAL R