InAs{sub 0.45}P{sub 0.55}/InP strained multiple quantum wells intermixed by inductively coupled plasma etching
Journal Article
·
· Materials Research Bulletin
- State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050 (China)
The intermixing effect on InAs{sub 0.45}P{sub 0.55}/InP strained multiple quantum wells (SMQWs) by inductively coupled plasma (ICP) etching and rapid thermal annealing (RTA) is investigated. Experiments show that the process of ICP etching followed RTA induces the blue shift of low temperature photoluminescence (PL) peaks of QWs. With increasing etching depth, the PL intensities are firstly enhanced and then diminished. This phenomenon is attributed to the variation of surface roughness and microstructure transformation inside the QW structure during ICP processing.
- OSTI ID:
- 22202519
- Journal Information:
- Materials Research Bulletin, Vol. 44, Issue 12; Other Information: Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
- Country of Publication:
- United States
- Language:
- English
Similar Records
1. 3 [mu]m InAs[sub y]P[sub 1[minus]y]--InP strained-layer quantum-well laser diodes grown by metalorganic chemical vapor deposition
Vacancy-mediated intermixing in InAs/InP(001) quantum dots subjected to ion implantation
Luminescence enhancement of plasma-etched InAsP/InGaAsP quantum wells
Journal Article
·
Tue Jun 01 00:00:00 EDT 1993
· IEEE Journal of Quantum Electronics (Institute of Electrical and Electronics Engineers); (United States)
·
OSTI ID:22202519
+2 more
Vacancy-mediated intermixing in InAs/InP(001) quantum dots subjected to ion implantation
Journal Article
·
Fri Aug 15 00:00:00 EDT 2008
· Journal of Applied Physics
·
OSTI ID:22202519
+6 more
Luminescence enhancement of plasma-etched InAsP/InGaAsP quantum wells
Journal Article
·
Sat Mar 15 00:00:00 EDT 2008
· Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films
·
OSTI ID:22202519
+4 more