skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Ferromagnetism in Ge{sub 1-x}Cr{sub x}Te epilayers grown by molecular beam epitaxy

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.2360903· OSTI ID:20860991
; ; ; ;  [1]
  1. Yamaguchi Prefectural Industrial Technology Institute, 4-1 Asutopia, Ube 755-0195 (Japan)

IV-VI ferromagnetic semiconductor Ge{sub 1-x}Cr{sub x}Te has been grown on BaF{sub 2} (111) by molecular beam epitaxy. The ferromagnetism was clearly established by direct magnetization and Hall measurements. The experimental correlation between the anomalous Hall resistivity {rho}{sub xy} and the resistivity {rho}{sub xx}, {rho}{sub xy}{proportional_to}{rho}{sub xx}{sup 1.76}, is understood from the semiclassical nature of the charge carrier dynamics, suggesting that the ferromagnetism gives rise to p-d exchange interaction. The Curie temperature increases systematically from the substrate temperature T{sub S} of 300 to 250 to 200 deg. C and with increasing the Cr composition along with each T{sub S}.

OSTI ID:
20860991
Journal Information:
Applied Physics Letters, Vol. 89, Issue 15; Other Information: DOI: 10.1063/1.2360903; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English