Evidence for rattling behavior of the filler atom (L) in the filled skutterudites LT{sub 4}X{sub 12} (L=Ce,Eu,Yb; T=Fe,Ru; X=P,Sb) from EXAFS studies
- Physics Deparment, University of California, Santa Cruz, California 95064 (United States)
- Department of Physics and Institute of Pure and Applied Physical Science, University of California, San Diego, La Jolla, California 92093 (United States)
Extended x-ray absorption fine structure (EXAFS) measurements have been carried out at the L K- or L{sub III}-edges (L=Ce, Eu, and Yb) and T K-edges (T=Fe and Ru) for a series of filled skutterudite materials, LT{sub 4}X{sub 12} (X=P and Sb). The high correlated Debye temperature ({theta}{sub D}{approx}400 K) obtained for the T-X peak indicates that the T{sub 4}X{sub 12} framework is relatively stiff. In contrast, the low Einstein temperature ({theta}{sub E}{approx}100 K) obtained for the L-X or T-L pairs strongly supports the concept of a 'rattling' local mode behavior for the L ions. The analysis also indicates that this rattling frequency is much smaller in the antimonide skutterudites than in the phosphide ones, and smaller in CeOs{sub 4}Sb{sub 12} than in CeFe{sub 4}Sb{sub 12}. Both results indicate that the larger the void within which the Ce atom is located, the lower the rattling frequency. In addition, for some systems in which the signal-to-noise for {sigma}{sup 2}(T) is high, a fit can be made to extract the reduced mass of the rattling atom; in these cases the obtained reduced mass is close to but slightly below that of the rattler atom mass-clear evidence of a localized mode inside a stiff but not rigid cage. Finally, no clear evidence for any off-center displacement of the filler ions was found in these materials.
- OSTI ID:
- 20664883
- Journal Information:
- Physical Review. B, Condensed Matter and Materials Physics, Vol. 70, Issue 9; Other Information: DOI: 10.1103/PhysRevB.70.094109; (c) 2004 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1098-0121
- Country of Publication:
- United States
- Language:
- English
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