Novel Edge-Enhanced X-ray Imaging by MIRRORCLE

Journal Article · Wed May 12 00:00:00 EDT 2004 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.1758048· OSTI ID:20652874

Hirai, T; Yamada, H; Sonoda, Y; Maki, S; Takashige, T; Takashima, T; Hasegawa, D; Toyosugi, N ^[1]

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1. Faculty of science and Engineering, Ritsumeikan University, 1-1-1 Nojihigashi, Kusatsu, Shiga 525-8577 (Japan)

Brilliant hard x-rays are produced by the portable synchrotron named MIRRORCLE. The x-ray images taken by MIRRORCLE show the enhanced edge effect even with contact imaging. Bodies composed of light elements are distinguished in spite of its dominated hard x-ray components. The imaging mechanism involved, which is different from the phase contrast, is studied in this paper. It is found that the edge effect is partly due to the micron order x-ray source spot size, and MeV region hard x-rays.

• OSTI ID: 20652874
• Journal Information: AIP Conference Proceedings, Vol. 705, Issue 1; Conference: 8. international conference on synchrotron radiation instrumentation, San Francisco, CA (United States), 25-29 Aug 2003; Other Information: DOI: 10.1063/1.1758048; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BEAM OPTICS
EQUIPMENT
HARD X RADIATION
IMAGES
MEV RANGE
RESOLUTION
SYNCHROTRON RADIATION
SYNCHROTRONS
X-RAY SOURCES