A reference-area-free strain mapping method using precession electron diffraction data

Zhao, Dexin; Patel, Aniket; Barbosa, Aaron; Hansen, Marcus H.; Wang, Ainiu L.; Dong, Jiaqi; Zhang, Yuwei; Umale, Tejas; Karaman, Ibrahim; Shamberger, Patrick; Banerjee, Sarbajit; Pharr, Matt; Xie, Kelvin Y.

doi:10.1016/j.ultramic.2023.113700

Title: A reference-area-free strain mapping method using precession electron diffraction data

Journal Article · Mon May 01 00:00:00 EDT 2023 · Ultramicroscopy

DOI:https://doi.org/10.1016/j.ultramic.2023.113700· OSTI ID:1957656

Zhao, Dexin; Patel, Aniket; Barbosa, Aaron; Hansen, Marcus H.; Wang, Ainiu L.; Dong, Jiaqi; Zhang, Yuwei; Umale, Tejas; Karaman, Ibrahim; Shamberger, Patrick; Banerjee, Sarbajit; Pharr, Matt;

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Sponsoring Organization:: USDOE

Grant/Contract Number:: SC0023353

OSTI ID:: 1957656

Journal Information:: Ultramicroscopy, Journal Name: Ultramicroscopy Vol. 247 Journal Issue: C; ISSN 0304-3991

Publisher:: ElsevierCopyright Statement

Country of Publication:: Netherlands

Language:: English

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