Strain mapping in TEM using precession electron diffraction

Taheri, Mitra Lenore; Leff, Asher Calvin

Title: Strain mapping in TEM using precession electron diffraction

Patent · Tue Feb 14 00:00:00 EST 2017

OSTI ID:1343758

Taheri, Mitra Lenore; Leff, Asher Calvin

A sample material is scanned with a transmission electron microscope (TEM) over multiple steps having a predetermined size at a predetermined angle. Each scan at a predetermined step and angle is compared to a template, wherein the template is generated from parameters of the material and the scanning. The data is then analyzed using local mis-orientation mapping and/or Nye's tensor analysis to provide information about local strain states.

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Research Organization:: Drexel Univ., Philadelphia, PA (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: SC0008274; NE0000315

Assignee:: Drexel University

Patent Number(s):: 9,568,442

Application Number:: 14/890,560

OSTI ID:: 1343758

Resource Relation:: Patent File Date: 2014 May 23

Country of Publication:: United States

Language:: English

References (14)

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