High resolution interface nanochemistry and structure

Technical Report · Mon Mar 01 00:00:00 EST 1993

DOI:https://doi.org/10.2172/10133013· OSTI ID:10133013

A summary is given of results on nanospectroscopy etc. during the previous three years, divided into the following subsections: development of methods and instrumentation for interface/boundary chemical analysis, interface and boundary structure in ceramic matrix composites, quantitative composition measurements of thin films and inclusions, theoretical calculations for electron energy loss near edge fine structure and grain boundary structure, and small probe radiation effects in ceramics. Materials studied include SiC whisker-reinforced Si3N4, SiC, Si oxides, Si, Si oxynitride, other ceramics. Methods mentioned include field emission, EELS (electron energy loss spectroscopy), nanospectroscopy, electron nanoprobe, etc.

• Research Organization: Arizona State Univ., Tempe, AZ (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: FG02-87ER45305
• OSTI ID: 10133013
• Report Number(s): DOE/ER/45305-T2; ON: DE93009750
• Resource Relation: Other Information: PBD: [1993]
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
36 MATERIALS SCIENCE
ENERGY-LOSS SPECTROSCOPY
COMPOSITE MATERIALS
CERAMICS
PROGRESS REPORT
FIELD EMISSION
MICROSCOPY
SILICON NITRIDES
SILICON CARBIDES
WHISKERS
MICROSTRUCTURE
SILICON OXIDES
SILICON
INCLUSIONS
GRAIN BOUNDARIES
THIN FILMS
INTERFACES
400101
360202
ACTIVATION, NUCLEAR REACTION, RADIOMETRIC, AND RADIOCHEMICAL PROCEDURES
STRUCTURE AND PHASE STUDIES