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Title: Spin microscope based on optically detected magnetic resonance

Patent ·
OSTI ID:993097

The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
W-7405-ENG-36
Assignee:
The United States of America as represented by the United States Department of Energy (Washington, DC)
Patent Number(s):
7,752,899
Application Number:
11/845,865
OSTI ID:
993097
Country of Publication:
United States
Language:
English