NMR characterization of thin films
Patent
·
OSTI ID:985652
- Glenview, IL
- Homer Glen, IL
- Chicago, IL
- Westchester, IL
A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- W-31-109-ENG-38
- Assignee:
- NMR characterization of thin films
- Patent Number(s):
- 7,456,630
- Application Number:
- 11/484,348; TRN: US201016%%2095
- OSTI ID:
- 985652
- Country of Publication:
- United States
- Language:
- English
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