Neutron beam irradiation study of workload dependence of SER in a microprocessor

Conference · Thu Jan 01 00:00:00 EST 2009

OSTI ID:956534

Michalak, Sarah E ^[1]; Graves, Todd L ^[1]; Hong, Ted ^[2]; Ackaret, Jerry ^[3]; Sonny, Rao ^[3]; Subhasish, Mitra ^[2]; Pia, Sanda ^[3]

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1. Los Alamos National Laboratory
2. STANFORD
3. IBM

It is known that workloads are an important factor in soft error rates (SER), but it is proving difficult to find differentiating workloads for microprocessors. We have performed neutron beam irradiation studies of a commercial microprocessor under a wide variety of workload conditions from idle, performing no operations, to very busy workloads resembling real HPC, graphics, and business applications. There is evidence that the mean times to first indication of failure, MTFIF defined in Section II, may be different for some of the applications.

• Research Organization: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC52-06NA25396
• OSTI ID: 956534
• Report Number(s): LA-UR-09-00352; LA-UR-09-352; TRN: US201014%%1903
• Resource Relation: Conference: SELSE 2009 ; March 24, 2009 ; Austin, TX
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
ERRORS
IRRADIATION
MICROPROCESSORS
NEUTRON BEAMS