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Title: Method and Apparatus for Creating a Topography at a Surface

Patent ·
OSTI ID:953736

Methods and apparatus whereby an optical interferometer is utilized to monitor and provide feedback control to an integrated energetic particle column, to create desired topographies, including the depth, shape and/or roughness of features, at a surface of a specimen. Energetic particle columns can direct energetic species including, ions, photons and/or neutral particles to a surface to create features having in-plane dimensions on the order of 1 micron, and a height or depth on the order of 1 nanometer. Energetic processes can include subtractive processes such as sputtering, ablation, focused ion beam milling and, additive processes, such as energetic beam induced chemical vapor deposition. The integration of interferometric methods with processing by energetic species offers the ability to create desired topographies at surfaces, including planar and curved shapes.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
Assignee:
Sandia Corporation (Albuquerque, NM)
Patent Number(s):
7,449,699
Application Number:
11/478,573
OSTI ID:
953736
Country of Publication:
United States
Language:
English

References (5)

Focused ion beam sculpting curved shape cavities in crystalline and amorphous targets
  • Adams, D. P.; Vasile, M. J.; Mayer, T. M.
  • Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 24, Issue 4 https://doi.org/10.1116/1.2210000
journal January 2006
Feedback-controlled ion beam sculpting apparatus journal April 2004
Depth control of focused ion-beam milling from a numerical model of the sputter process
  • Vasile, Michael J.; Xie, Jushan; Nassar, Raja
  • Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 17, Issue 6 https://doi.org/10.1116/1.590959
journal January 1999
Coaxial Ion-Photon System journal September 2001
Imaging and Material Analysis from Sputter-Induced Light Emission Using Coaxial Ion-Photon Column journal September 2002

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