Crystal Growth and Wafer Processing for High Yield and High Efficiency Solar Cells: Final Report, 1 October 2003 - 15 January 2008

Technical Report · Sat Nov 01 00:00:00 EDT 2008

DOI:https://doi.org/10.2172/942087· OSTI ID:942087

Rozgonyi, G A; Youssef, K

Hardness, elastic modulus, and fracture toughness of low and high carrier-lietime regions in polycrystalline silicon were evaluated using the nanoindentation technique.

• Research Organization: National Renewable Energy Lab. (NREL), Golden, CO (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC36-99-GO10337
• OSTI ID: 942087
• Report Number(s): NREL/SR-520-44375; AAT-2-31605-06; TRN: US200902%%90
• Resource Relation: Related Information: Work performed by North Carolina State University, Raleigh, North Carolina
• Country of Publication: United States
• Language: English

Related Subjects

14 SOLAR ENERGY
36 MATERIALS SCIENCE
CARRIER LIFETIME
CRYSTAL GROWTH
DEFECTS
DISLOCATIONS
EFFICIENCY
FRACTURE PROPERTIES
GRAIN BOUNDARIES
HARDNESS
IMPURITIES
INTERSTITIALS
LIFETIME
MECHANICAL PROPERTIES
OXYGEN
POINT DEFECTS
SILICON
SOLAR CELLS
PV
WAFER PROCESS
HIGH YIELD
HIGH EFFICIENCY
GRAIN BOUNDARY
LIGHT ELEMENT IMPURITIES
NANOINDENTATION
POLYCRYSTALLINE SILICON
Solar Energy - Photovoltaics