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Title: EXAFS Measurements of Laser-Shocked V and Ti and Crystal Phase Transformation in Ti

Journal Article · · Physical Review Letters
OSTI ID:936660

Extended X-Ray Absorption Fine Structure (EXAFS), using a laser-imploded target as a source, can yield the properties of laser-shocked metals on a nanosecond time scale. EXAFS measurements of vanadium shocked to {approx}0.4 Mbar yield the compression and temperature in good agreement with hydrodynamic simulations and shock-speed measurements. In laser-shocked titanium at the same pressure, the EXAFS modulation damping is much higher than warranted by the predicted temperature increase. This is shown to be due to the {alpha}-Ti to {omega}-Ti crystal-phase transformation, known to occur below {approx}0.1 Mbar for slower shock waves. The dynamics of material response to shock loading has been extensively studied in the past [1]. The goal of those studies has been to understand the shock-induced deformation and structural changes at the microscopic level [2]. Laser-generated shocks can be employed to broaden these studies to higher pressures ({approx}1 Mbar) and strain rates ({approx} 10{sup 7}-10{sup 8} s{sup -1}). Recently, laser-shocked materials have been studied with in-situ x-ray diffraction [3,4]. The goal of this work is to examine the use of in-situ EXAFS [5] as a complementary characterization of laser-shocked metals. EXAFS is the modulation in the x-ray absorption above the K edge (or L edge) due to the interference of the photoelectron waves with the waves reflected from neighboring atoms. The frequency of EXAFS modulations is related to the inter-particle distance, hence to the compression. The damping rate of the modulation can yield the lattice temperature, which is not readily available by other methods.

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
936660
Report Number(s):
UCRL-JRNL-203138; PRLTAO; TRN: US200818%%979
Journal Information:
Physical Review Letters, Vol. 92, Issue 9; ISSN 0031-9007
Country of Publication:
United States
Language:
English