ToF-SIMS study of polycrystalline uranium after exposure to deuterium
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is employed to examine specific features observed on a polycrystalline depleted uranium sample after exposure to high purity D{sub 2} gas. The ToF-SIMS investigation, being the first of its kind on uranium, investigates a site where the deuterated form of uranium hydride (UD{sub 3}) is clearly observed to have broken through the thin, air-formed oxide. Density functional theory calculations have been performed, which confirm the stability of, and also assign structural geometries to, the various uranium containing fragments observed with SIMS. An inclusion site was also investigated using ToF-SIMS, and these data suggest that the edges of such inclusions exhibit increased D ion, and hence H ion, diffusion when compared to the surrounding surface oxide. These results offer support to the previously published hypotheses that inclusion sites on uranium surfaces exhibit an increased probability to form hydride sites under H{sub 2} exposure.
- Research Organization:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 920856
- Report Number(s):
- UCRL-JRNL-218359; TRN: US0802035
- Journal Information:
- Philosophical Magazine, vol. 87, no. 8, August 1, 2007, pp. 541-547, Vol. 87, Issue 8
- Country of Publication:
- United States
- Language:
- English
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