Automated position control of a surface array relative to a liquid microjunction surface sampler

Patent · Tue Nov 13 00:00:00 EST 2007

OSTI ID:919880

Van Berkel, Gary J ^[1]; Kertesz, Vilmos ^[2]; Ford, Michael James ^[3]

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1. Clinton, TN
2. Knoxville, TN
3. Little Rock, AR

A system and method utilizes an image analysis approach for controlling the probe-to-surface distance of a liquid junction-based surface sampling system for use with mass spectrometric detection. Such an approach enables a hands-free formation of the liquid microjunction used to sample solution composition from the surface and for re-optimization, as necessary, of the microjunction thickness during a surface scan to achieve a fully automated surface sampling system.

• Research Organization: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC05-00OR22725
• Assignee: UT-Battelle, LLC (Oak Ridge, TN)
• Patent Number(s): 7,295,026
• Application Number: 11/144,882
• OSTI ID: 919880
• Country of Publication: United States
• Language: English