Variable magnification with Kirkpatrick-Baez optics for synchrotron X-ray microscopy
Journal Article
·
· Journal of Research of the National Institute of Standards and Technology
- National Institute of Standards and Technology, Gaithersburg, MD (United States)
- Purdue Univ., West Lafayette, IN (United States)
- J. Pedulla Associates, Silver Springs, MD (United States)
- Argonne National Lab. (ANL), Argonne, IL (United States)
In this study, we describe the distinction between the operation of a short focal length x-ray microscope forming a real image with a laboratory source (convergent illumination) and with a highly collimated intense beam from a synchrotron light source (Kohler illumination).
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE
- Grant/Contract Number:
- AC02-06CH11357
- OSTI ID:
- 898720
- Journal Information:
- Journal of Research of the National Institute of Standards and Technology, Vol. 111, Issue 3; ISSN 1044-677X
- Publisher:
- National Institute of Standards (NIST)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Cited by: 4 works
Citation information provided by
Web of Science
Web of Science
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