Wavelength and pulselength dependence of laser conditioning and bulk damage in doubler-cut KH2PO4
An experimental technique has been utilized to measure the variation of bulk damage scatter with damaging fluence in plates of KH{sub 2}PO{sub 4} (KDP) crystals. Bulk damage in unconditioned and laser-conditioned doubler-cut KDP crystals has been studied using 527 nm (2{omega}) light at pulselengths of 0.3-10 ns. It is found that there is less scatter due to damage at fixed fluence for longer pulselengths. In particular, there is {approx}4X increase in fluence for equivalent scatter for damage at 2{omega}, 10 ns as compared to 0.30 ns in unconditioned KDP. The results for the unconditioned and conditioned KDP show that for all the pulselengths the scatter due to the bulk damage is a strong function of the damaging fluence ({phi}{sup -5}). It is determined that the 2{omega} fluence pulselength-scaling for equivalent bulk damage scatter in unconditioned KDP varies as {tau}{sup 0.30{+-}0.11} and in 3{omega}, 3ns ramp-conditioned KDP varies as {tau}{sup 0.27{+-}0.14}. The effectiveness of 2{omega} and 3{omega} laser conditioning at pulselengths in the range of 0.30-23 ns for damage induced 2{omega}, 3 ns is analyzed in terms of scatter. For the protocols tested (i.e. peak conditioning irradiance, etc.), the 3{omega}, 300 ps conditioning to a peak fluence of 3 J/cm{sup 2} had the best performance under 2{omega}, 3 ns testing. The general trend in the performance of the conditioning protocols was shorter wavelength and shorter pulselength appear to produce better conditioning for testing at 2{omega}, 3 ns.
- Research Organization:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 877936
- Report Number(s):
- UCRL-PROC-216743; TRN: US200608%%771
- Resource Relation:
- Conference: Presented at: Boulder Damage Symposium XXXVII, Boulder, CO, United States, Sep 19 - Sep 21, 2005
- Country of Publication:
- United States
- Language:
- English
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