X-ray imaging crystal spectrometer for extended X-ray sources

Patent · Mon Jan 01 00:00:00 EST 2001

OSTI ID:873852

Bitter, Manfred L ^[1]; Fraenkel, Ben ^[2]; Gorman, James L ^[3]; Hill, Kenneth W ^[4]; Roquemore, A Lane ^[5]; Stodiek, Wolfgang ^[1]; von Goeler, Schweickhard E ^[1]

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1. Princeton, NJ
2. Jerusalem, IL
3. Bordentown, NJ
4. Lawrenceville, NJ
5. Cranbury, NJ

Spherically or toroidally curved, double focusing crystals are used in a spectrometer for X-ray diagnostics of an extended X-ray source such as a hot plasma produced in a tokomak fusion experiment to provide spatially and temporally resolved data on plasma parameters using the imaging properties for Bragg angles near 45. For a Bragg angle of 45.degree., the spherical crystal focuses a bundle of near parallel X-rays (the cross section of which is determined by the cross section of the crystal) from the plasma to a point on a detector, with parallel rays inclined to the main plain of diffraction focused to different points on the detector. Thus, it is possible to radially image the plasma X-ray emission in different wavelengths simultaneously with a single crystal.

• Research Organization: Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States)
• DOE Contract Number: AC02-76CH03073
• Assignee: United States of America as represented by United States Department (Washington, DC)
• Patent Number(s): US 6259763
• OSTI ID: 873852
• Country of Publication: United States
• Language: English

Related Subjects

x-ray
imaging
crystal
spectrometer
extended
sources
spherically
toroidally
curved
double
focusing
crystals
diagnostics
source
hot
plasma
produced
tokomak
fusion
experiment
provide
spatially
temporally
resolved
data
parameters
properties
bragg
angles
near
45
angle
degree
spherical
focuses
bundle
parallel
x-rays
section
determined
detector
rays
inclined
main
plain
diffraction
focused
radially
image
emission
wavelengths
simultaneously
single
hot plasma
plasma produced
ray imaging
x-ray source
single crystal
x-ray imaging
x-ray emission
plasma parameters
x-ray sources
tokomak fusion
extended x-ray
near parallel
parallel x-ray
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