System and method for optically locating microchannel positions

Patent · Mon Jan 01 00:00:00 EST 2001

OSTI ID:873704

Brewer, Laurence R ^[1]; Kimbrough, Joseph ^[2]; Balch, Joseph ^[3]; Davidson, J Courtney ^[3]

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1. Oakland, CA
2. Pleasanton, CA
3. Livermore, CA

A system and method is disclosed for optically locating a microchannel position. A laser source generates a primary laser beam which is directed at a microchannel plate. The microchannel plates include microchannels at various locations. A back-reflectance beam detector receives a back-reflected beam from the plate. The back-reflected beam is generated when the primary beam reflects off of the plate. A photodiode circuit generates a trigger signal when the back-reflected beam exceeds a predetermined threshold, indicating a presence of the microchannel. The method of the present invention includes the steps of generating a primary beam, directing the primary beam to a plate containing a microchannel, receiving from the plate a back-reflected beam generated in response to the primary beam, and generating a trigger signal when the back-reflected beam exceeds a predetermined threshold which corresponds to a presence of the microchannel.

• Research Organization: Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
• DOE Contract Number: W-7405-ENG-48
• Assignee: Regents of University of California (Oakland, CA)
• Patent Number(s): US 6225635
• OSTI ID: 873704
• Country of Publication: United States
• Language: English

Related Subjects

method
optically
locating
microchannel
positions
disclosed
position
laser
source
generates
primary
beam
directed
plate
plates
microchannels
various
locations
back-reflectance
detector
receives
back-reflected
generated
reflects
photodiode
circuit
trigger
signal
exceeds
predetermined
threshold
indicating
presence
steps
generating
directing
containing
receiving
response
corresponds
channel plate
circuit generates
predetermined threshold
laser beam
laser source
microchannel plate
plate containing
primary beam
trigger signal
reflected beam
various locations
microchannel plates
source generates
beam detector
beam generated
optically locating
microchannel position
source generate
detector receives
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