High-speed non-contact measuring apparatus for gauging the thickness of moving sheet material

Patent · Sat Jan 01 00:00:00 EST 2000

OSTI ID:872916

Grann, Eric B ^[1]; Holcomb, David E ^[2]

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1. San Ramon, CA
2. Oak Ridge, TN

An optical measurement apparatus is provided for measuring the thickness of a moving sheet material (18). The apparatus has a pair of optical measurement systems (21, 31) attached to opposing surfaces (14, 16) of a rigid support structure (10). A pair of high-power laser diodes (20,30) and a pair of photodetector arrays (22,32) are attached to the opposing surfaces. Light emitted from the laser diodes is reflected off of the sheet material surfaces (17, 19) and received by the respective photodetector arrays. An associated method for implementing the apparatus is also provided.

• Research Organization: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
• DOE Contract Number: AC05-96OR22464
• Assignee: Lockheed Martin Energy Research Corp. (Oak Ridge, TN)
• Patent Number(s): US 6038028
• OSTI ID: 872916
• Country of Publication: United States
• Language: English

Related Subjects

high-speed
non-contact
measuring
apparatus
gauging
thickness
moving
sheet
material
optical
measurement
provided
18
pair
systems
21
31
attached
opposing
surfaces
14
16
rigid
support
structure
10
high-power
laser
diodes
20
30
photodetector
arrays
22
32
light
emitted
reflected
17
19
received
respective
associated
method
implementing
associated method
high-power laser
measurement apparatus
photodetector array
laser diodes
detector array
laser diode
support structure
material surface
power laser
light emitted
sheet material
opposing surfaces
measurement systems
measuring apparatus
material surfaces
moving sheet
opposing surface
optical measurement
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