Beam characterization by wavefront sensor

Patent · Fri Jan 01 00:00:00 EST 1999

OSTI ID:872444

Neal, Daniel R ^[1]; Alford, W J ^[2]; Gruetzner, James K ^[3]

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1. 17 Eric Alan Lane, Tijeras, NM 87059
2. 3455 Tahoe, N.E., Albuquerque, NM 87111
3. 9407 Shoehone, N.E., Albuquerque, NM 87111

An apparatus and method for characterizing an energy beam (such as a laser) with a two-dimensional wavefront sensor, such as a Shack-Hartmann lenslet array. The sensor measures wavefront slope and irradiance of the beam at a single point on the beam and calculates a space-beamwidth product. A detector array such as a charge coupled device camera is preferably employed.

• Research Organization: Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
• DOE Contract Number: AC04-94AL85000
• Assignee: Neal, Daniel R. (17 Eric Alan Lane, Tijeras, NM 87059);Alford, W. J. (3455 Tahoe, N.E., Albuquerque, NM 87111);Gruetzner, James K. (9407 Shoehone, N.E., Albuquerque, NM 87111)
• Patent Number(s): US 5936720
• OSTI ID: 872444
• Country of Publication: United States
• Language: English

Related Subjects

beam
characterization
wavefront
sensor
apparatus
method
characterizing
energy
laser
two-dimensional
shack-hartmann
lenslet
array
measures
slope
irradiance
single
calculates
space-beamwidth
product
detector
charge
coupled
device
camera
preferably
employed
energy beam
sensor measures
wavefront sensor
charge coupled
coupled device
detector array
device camera
lenslet array
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