Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material

Patent · Wed Jan 01 00:00:00 EST 1997

OSTI ID:870786

Weiss, Jonathan D ^[1]

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1. Albuquerque, NM

A voltage monitor which uses the shift in absorption edge of crystalline material to measure strain resulting from electric field-induced deformation of piezoelectric or electrostrictive material, providing a simple and accurate means for measuring voltage applied either by direct contact with the crystalline material or by subjecting the material to an electric field.

• Research Organization: AT&T
• DOE Contract Number: AC04-76DP00789
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 5594240
• OSTI ID: 870786
• Country of Publication: United States
• Language: English

Related Subjects

strain-optic
voltage
monitor
strain
causes
change
optical
absorption
crystalline
material
shift
edge
measure
resulting
electric
field-induced
deformation
piezoelectric
electrostrictive
providing
simple
accurate
means
measuring
applied
direct
contact
subjecting
field
voltage monitor
crystalline material
optical absorption
voltage applied
direct contact
electric field
absorption edge
measuring voltage
induced deformation
optic voltage
rate means
rate mean
accurate means
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