Method for increased sensitivity of radiation detection and measurement

Patent · Sat Jan 01 00:00:00 EST 1994

OSTI ID:869551

Miller, Steven D ^[1]

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1. Richland, WA

Dose of radiation to which a body of crystalline material has been exposed is measured by exposing the body to optical radiation at a first wavelength, which is greater than about 540 nm, and measuring optical energy emitted from the body by luminescence at a second wavelength, which is longer than the first wavelength. Reduced background is accomplished by more thorough annealing and enhanced radiation induced luminescence is obtained by treating the crystalline material to coalesce primary damage centers into secondary damage centers.

• Research Organization: Battelle Memorial Institute, Columbus, OH (United States)
• DOE Contract Number: AC06-76RL01830
• Assignee: Battelle Memorial Institute (Richland, WA)
• Patent Number(s): US 5354997
• OSTI ID: 869551
• Country of Publication: United States
• Language: English

Related Subjects

method
increased
sensitivity
radiation
detection
measurement
dose
crystalline
material
exposed
measured
exposing
optical
wavelength
540
nm
measuring
energy
emitted
luminescence
reduced
background
accomplished
thorough
annealing
enhanced
induced
obtained
treating
coalesce
primary
damage
centers
secondary
measuring optical
increased sensitivity
radiation induced
crystalline material
optical energy
radiation detection
optical radiation
reduced background
enhanced radiation
energy emitted
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