Internal temperature monitor for work pieces
- Salem, OH
A method and apparatus for measuring the internal temperature of a work piece comprises an excitation laser for generating laser pulses which are directed through a water cooled probe, and in an optical fiber, to a first surface of the work piece. The laser is of sufficient intensity to ablate the surface of the work piece, producing a displacement and a resulting ultrasonic pulse which propagates within the thickness of the work piece to an opposite surface. The ultrasonic pulse is reflected from the opposite surface and returns to the first surface to create a second displacement. A second continuous laser also shines its light through an optical fiber in the probe into the first surface and is used in conjunction with signal processing equipment to measure the time between the first and second displacements. This time is proportional to the time-of-flight of the ultrasonic pulse in the work piece which, with a known or detected thickness of the work piece, can be used to calculate the internal temperature of the work piece.
- Research Organization:
- Babcock and Wilcox Co., Alliance, OH (USA)
- DOE Contract Number:
- FC07-89ID12875
- Assignee:
- Babcock & Wilcox Company (New Orleans, LA)
- Patent Number(s):
- US 5226730
- OSTI ID:
- 868849
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
temperature
monitor
pieces
method
apparatus
measuring
piece
comprises
excitation
laser
generating
pulses
directed
water
cooled
probe
optical
fiber
surface
sufficient
intensity
ablate
producing
displacement
resulting
ultrasonic
pulse
propagates
thickness
opposite
reflected
returns
create
continuous
shines
light
conjunction
signal
processing
equipment
measure
time
displacements
proportional
time-of-flight
detected
calculate
sufficient intensity
excitation laser
ultrasonic pulse
signal processing
laser pulses
laser pulse
optical fiber
opposite surface
water cooled
processing equipment
internal temperature
signal process
temperature monitor
site surface
cooled probe
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