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Title: Method and means of directing an ion beam onto an insulating surface for ion implantation or sputtering

Patent ·
OSTI ID:863935

A beam of ions is directed under control onto an insulating surface by supplying simultaneously a stream of electrons directed at the same surface in a quantity sufficient to neutralize the overall electric charge of the ion beam and result in a net zero current flow to the insulating surface. The ion beam is adapted particularly both to the implantation of ions in a uniform areal disposition over the insulating surface and to the sputtering of atoms or molecules of the insulator onto a substrate.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Assignee:
United States of America as represented by United States (Washington, DC)
Patent Number(s):
US 4278890
OSTI ID:
863935
Country of Publication:
United States
Language:
English