Focal-surface detector for heavy ions

Patent · Mon Jan 01 00:00:00 EST 1979

OSTI ID:863327

Erskine, John R ^[1]; Braid, Thomas H ^[2]; Stoltzfus, Joseph C ^[3]

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1. Downers Grove, IL
2. La Grange Park, IL
3. Beloit, WI

A detector of the properties of individual charged particles in a beam includes a gridded ionization chamber, a cathode, a plurality of resistive-wire proportional counters, a plurality of anode sections, and means for controlling the composition and pressure of gas in the chamber. Signals generated in response to the passage of charged particles can be processed to identify the energy of the particles, their loss of energy per unit distance in an absorber, and their angle of incidence. In conjunction with a magnetic spectrograph, the signals can be used to identify particles and their state of charge. The detector is especially useful for analyzing beams of heavy ions, defined as ions of atomic mass greater than 10 atomic mass units.

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL (United States)
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 4150290
• OSTI ID: 863327
• Country of Publication: United States
• Language: English

Related Subjects

focal-surface
detector
heavy
properties
individual
charged
particles
beam
gridded
ionization
chamber
cathode
plurality
resistive-wire
proportional
counters
anode
sections
means
controlling
composition
pressure
gas
signals
generated
response
passage
processed
identify
energy
loss
unit
distance
absorber
angle
incidence
conjunction
magnetic
spectrograph
charge
especially
useful
analyzing
beams
defined
atomic
mass
10
units
atomic mass
proportional counter
especially useful
charged particles
charged particle
ionization chamber
signals generated
anode section
proportional counters
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