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Title: Differential auger spectrometry

Abstract

Differential Auger spectroscopy method for increasing the sensitivity of micro-Auger spectroanalysis of the surfaces of dilute alloys, by alternately periodically switching an electron beam back and forth between an impurity free reference sample and a test sample containing a trace impurity. The Auger electrons from the samples produce representative Auger spectrum signals which cancel to produce an Auger test sample signal corresponding to the amount of the impurity in the test samples.

Inventors:
; ;
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
US Atomic Energy Commission (AEC)
OSTI Identifier:
862584
Patent Number(s):
3,965,351
Application Number:
05/519324
Assignee:
United States of America as represented by United States Energy (Washington, DC)
DOE Contract Number:  
AT(30-1)-16
Resource Type:
Patent
Resource Relation:
Patent File Date: 1974 Oct 30
Country of Publication:
United States
Language:
English
Subject:
differential; auger; spectrometry; spectroscopy; method; increasing; sensitivity; micro-auger; spectroanalysis; surfaces; dilute; alloys; alternately; periodically; switching; electron; beam; forth; impurity; free; reference; sample; containing; trace; electrons; samples; produce; representative; spectrum; signals; cancel; signal; corresponding; amount; signal corresponding; spectroscopy method; sample signal; sample containing; electron beam; reference sample; trace impurity; differential auger; /250/

Citation Formats

Strongin, Myron, Varma, Matesh Narayan, and Anne, Joshi. Differential auger spectrometry. United States: N. p., 1976. Web.
Strongin, Myron, Varma, Matesh Narayan, & Anne, Joshi. Differential auger spectrometry. United States.
Strongin, Myron, Varma, Matesh Narayan, and Anne, Joshi. 1976. "Differential auger spectrometry". United States. https://www.osti.gov/servlets/purl/862584.
@article{osti_862584,
title = {Differential auger spectrometry},
author = {Strongin, Myron and Varma, Matesh Narayan and Anne, Joshi},
abstractNote = {Differential Auger spectroscopy method for increasing the sensitivity of micro-Auger spectroanalysis of the surfaces of dilute alloys, by alternately periodically switching an electron beam back and forth between an impurity free reference sample and a test sample containing a trace impurity. The Auger electrons from the samples produce representative Auger spectrum signals which cancel to produce an Auger test sample signal corresponding to the amount of the impurity in the test samples.},
doi = {},
url = {https://www.osti.gov/biblio/862584}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Thu Jan 01 00:00:00 EST 1976},
month = {Thu Jan 01 00:00:00 EST 1976}
}