U.S. Department of EnergyOffice of Scientific and Technical Information
High-Frequency Electromagnetic Impedance Measurements for Characterization, Monitoring and Verification Efforts
Abstract
Non-invasive, high-resolution imaging of the shallow subsurface is needed for delineation of buried waste, detection of unexploded ordinance, verification and monitoring of containment structures, and other environmental applications. Electromagnetic (EM) measurements at frequencies between 1 and 100 MHz are important for such applications, because the induction number of many targets is small and the ability to determine the dielectric permittivity in addition to electrical conductivity of the subsurface is possible. Earlier workers were successful in developing systems for detecting anomalous areas, but no quantifiable information was accurately determined. For high-resolution imaging, accurate measurements are necessary so the field data can be mapped into the space of the subsurface parameters. We are developing a non-invasive method for accurately mapping the electrical conductivity and dielectric permittivity of the shallow subsurface using the EM impedance approach (Frangos, 2001; Lee and Becker, 2001; Song et al., 2002). Electric and magnetic sensors are being tested in a known area against theoretical predictions, thereby insuring that the data collected with the high-frequency impedance (HFI) system will support high-resolution, multi-dimensional imaging techniques.
- Authors:
- Publication Date:
- Research Org.:
- Lawrence Berkeley National Lab., Berkeley, CA (US)
- Sponsoring Org.:
- USDOE Office of Environmental Management (EM) (US)
- OSTI Identifier:
- 834460
- Report Number(s):
- EMSP-73776-2002
R&D Project: EMSP 73776; TRN: US200432%%325
- Resource Type:
- Technical Report
- Resource Relation:
- Other Information: PBD: 20 Nov 2002
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; 54 ENVIRONMENTAL SCIENCES; CONTAINMENT; DETECTION; DIELECTRIC MATERIALS; ELECTRIC CONDUCTIVITY; IMPEDANCE; INDUCTION; MONITORING; PERMITTIVITY; TARGETS; VERIFICATION
Citation Formats
Lee, Ki Ha, Becker, Alex, and Tseng, Hung-Wen. High-Frequency Electromagnetic Impedance Measurements for Characterization, Monitoring and Verification Efforts. United States: N. p., 2002.
Web. doi:10.2172/834460.
Lee, Ki Ha, Becker, Alex, & Tseng, Hung-Wen. High-Frequency Electromagnetic Impedance Measurements for Characterization, Monitoring and Verification Efforts. United States. https://doi.org/10.2172/834460
Lee, Ki Ha, Becker, Alex, and Tseng, Hung-Wen. 2002.
"High-Frequency Electromagnetic Impedance Measurements for Characterization, Monitoring and Verification Efforts". United States. https://doi.org/10.2172/834460. https://www.osti.gov/servlets/purl/834460.
@article{osti_834460,
title = {High-Frequency Electromagnetic Impedance Measurements for Characterization, Monitoring and Verification Efforts},
author = {Lee, Ki Ha and Becker, Alex and Tseng, Hung-Wen},
abstractNote = {Non-invasive, high-resolution imaging of the shallow subsurface is needed for delineation of buried waste, detection of unexploded ordinance, verification and monitoring of containment structures, and other environmental applications. Electromagnetic (EM) measurements at frequencies between 1 and 100 MHz are important for such applications, because the induction number of many targets is small and the ability to determine the dielectric permittivity in addition to electrical conductivity of the subsurface is possible. Earlier workers were successful in developing systems for detecting anomalous areas, but no quantifiable information was accurately determined. For high-resolution imaging, accurate measurements are necessary so the field data can be mapped into the space of the subsurface parameters. We are developing a non-invasive method for accurately mapping the electrical conductivity and dielectric permittivity of the shallow subsurface using the EM impedance approach (Frangos, 2001; Lee and Becker, 2001; Song et al., 2002). Electric and magnetic sensors are being tested in a known area against theoretical predictions, thereby insuring that the data collected with the high-frequency impedance (HFI) system will support high-resolution, multi-dimensional imaging techniques.},
doi = {10.2172/834460},
url = {https://www.osti.gov/biblio/834460},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Nov 20 00:00:00 EST 2002},
month = {Wed Nov 20 00:00:00 EST 2002}
}