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Title: Beamline smoothing of the Advanced Photon Source

Conference ·
OSTI ID:81100

This paper outlines a general beamline smoothing concept based on the use of First Principle Component analysis. Bean-dine smoothing is commonly used for the detection of blunders in the positioning of beam elements and to provide a smooth particle beam path with the fewest adjustments to individual beam components. It also provides the data for assessment of the achieved positioning quality.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
W-31-109-ENG-38
OSTI ID:
81100
Report Number(s):
ANL/ASD/CP-84924; CONF-950512-171; ON: DE95013415
Resource Relation:
Conference: 16. Institute of Electrical and Electronic Engineers (IEEE) particle accelerator conference, Dallas, TX (United States), 1-5 May 1995; Other Information: PBD: [1995]
Country of Publication:
United States
Language:
English