Scintillator Evaluation for High-Energy X-Ray Diagnostics
This report presents results derived from a digital radiography study performed using x-rays from a 2.3 MeV, rod-pinch diode. Detailed is a parameter study of cerium-doped lutetium ortho-silicate (LSO) scintillator thickness, as it relates to system resolution and detection quantum efficiency (DQE). Additionally, the detection statistics of LSO were compared with that of CsI(Tl). As a result of this study we found the LSO scintillator with a thickness of 3 mm to yield the highest system DQE over the range of spatial frequencies from 0.75 to 2.5 mm{sup -1}.
- Research Organization:
- Bechtel Nevada Corporation (US)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- AC08-96NV11718
- OSTI ID:
- 790063
- Report Number(s):
- DOE/NV/11718-653; TRN: US0200346
- Resource Relation:
- Other Information: PBD: 1 Sep 2001
- Country of Publication:
- United States
- Language:
- English
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