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Title: Scintillator Evaluation for High-Energy X-Ray Diagnostics

Technical Report ·
DOI:https://doi.org/10.2172/790063· OSTI ID:790063

This report presents results derived from a digital radiography study performed using x-rays from a 2.3 MeV, rod-pinch diode. Detailed is a parameter study of cerium-doped lutetium ortho-silicate (LSO) scintillator thickness, as it relates to system resolution and detection quantum efficiency (DQE). Additionally, the detection statistics of LSO were compared with that of CsI(Tl). As a result of this study we found the LSO scintillator with a thickness of 3 mm to yield the highest system DQE over the range of spatial frequencies from 0.75 to 2.5 mm{sup -1}.

Research Organization:
Bechtel Nevada Corporation (US)
Sponsoring Organization:
US Department of Energy (US)
DOE Contract Number:
AC08-96NV11718
OSTI ID:
790063
Report Number(s):
DOE/NV/11718-653; TRN: US0200346
Resource Relation:
Other Information: PBD: 1 Sep 2001
Country of Publication:
United States
Language:
English