X-ray photoemission electron microscopy, a tool for the investigation of complex magnetic structures.
X-ray Photoemission Electron Microscopy unites the chemical specificity and magnetic sensitivity of soft x-ray absorption techniques with the high spatial resolution of electron microscopy. The discussed instrument possesses a spatial resolution of better than 50 nm and is located at a bending magnet beamline at the Advanced Light Source, providing linearly and circularly polarized radiation between 250 and 1300 eV. We will present examples which demonstrate the power of this technique applied to problems in the field of thin film magnetism. The chemical and elemental specificity is of particular importance for the study of magnetic exchange coupling because it allows separating the signal of the different layers and interfaces in complex multi-layered structures.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE Director, Office of Science. Office of Basic Energy Studies. Division of Materials Sciences (US)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 787169
- Report Number(s):
- LBNL-48852; LBNL/ALS-43825; R&D Project: A58128; TRN: US200305%%931
- Resource Relation:
- Conference: SRI 2001, Madison, WI (US), 08/21/2001--08/24/2001; Other Information: Supercedes report DE00787169; PBD: 30 Aug 2001;Review of Scientific Instruments, Vol. 73, No. 3, pp. 1362-1366, March 2002; PBD: 30 Aug 2001
- Country of Publication:
- United States
- Language:
- English
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