X-Ray Imaging Crystal Spectrometer for Extended X-Ray Sources
Spherically or toroidally curved, double focusing crystals are used in a spectrometer for X-ray diagnostics of an extended X-ray source such as a hot plasma produced in a tokamak fusion experiment to provide spatially and temporally resolved data on plasma parameters such as ion temperature, toroidal and poloidal rotation, electron temperature, impurity ion charge-state distributions, and impurity transport. The imaging properties of these spherically or toroidally curved crystals provide both spectrally and spatially resolved X-ray data from the plasma using only one small spherically or toroidally curved crystal, thus eliminating the requirement for a large array of crystal spectrometers and the need to cross-calibrate the various crystals.
- Research Organization:
- Princeton Plasma Physics Lab. (PPPL), Princeton, NJ (United States)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- AC02-76CH03073
- Assignee:
- DOEGC; EDB-01:070359
- Patent Number(s):
- PATENTS-US-A9315834
- Application Number:
- 9-315,834; TRN: AH200128%%151
- OSTI ID:
- 782751
- Resource Relation:
- Patent File Date: 1999 May 01; Other Information: PBD: 1 May 1999
- Country of Publication:
- United States
- Language:
- English
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