INELASTIC X-RAY SCATTERING AT ULTRAHIGH PRESSURES.
Abstract
Inelastic x-ray scattering (IXS) provides high-pressure research with an arsenal of analytical capabilities for key measurements that were previously unattainable, and high pressure research provides IXS with numerous applications where the technique has unique advantages over other methods. High-pressure investigations can now be conducted using non-resonant IXS, resonant IXS, nuclear resonant IXS, and x-ray emission spectroscopy with energy resolutions of 100 meV to 1 eV for electronic transitions and 1 to 10 meV for phonon studies. By pressure-tuning materials over a wide range, we are able to investigate fundamental physics of electron gases, strongly correlated electron systems, high-energy electronic excitations, and phonons in energy and momentum space. The results will have a profound influence on materials applications as well as providing basic information for understanding the deep interior of the Earth and other planets.
- Authors:
- Publication Date:
- Research Org.:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Org.:
- USDOE Office of Energy Research (ER) (US)
- OSTI Identifier:
- 782060
- Report Number(s):
- BNL-68351; KC0204011
R&D Project: LS1; KC0204011; TRN: US0103097
- DOE Contract Number:
- AC02-98CH10886
- Resource Type:
- Conference
- Resource Relation:
- Conference: EUROPEAN SUMMER SCHOOL 2000 NEW MATERIALS AND THEIR DYNAMICS ADVANCES THROUGH SYNCHROTRON RADIATION, ROSTOCK (DE), 08/28/2000--09/08/2000; Other Information: PBD: 28 Aug 2000
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; INELASTIC SCATTERING; SYNCHROTRON RADIATION; X RADIATION; USES; PRESSURE DEPENDENCE
Citation Formats
MAO, H K, HEMLEY, J, and KAO, C C. INELASTIC X-RAY SCATTERING AT ULTRAHIGH PRESSURES.. United States: N. p., 2000.
Web.
MAO, H K, HEMLEY, J, & KAO, C C. INELASTIC X-RAY SCATTERING AT ULTRAHIGH PRESSURES.. United States.
MAO, H K, HEMLEY, J, and KAO, C C. 2000.
"INELASTIC X-RAY SCATTERING AT ULTRAHIGH PRESSURES.". United States. https://www.osti.gov/servlets/purl/782060.
@article{osti_782060,
title = {INELASTIC X-RAY SCATTERING AT ULTRAHIGH PRESSURES.},
author = {MAO, H K and HEMLEY, J and KAO, C C},
abstractNote = {Inelastic x-ray scattering (IXS) provides high-pressure research with an arsenal of analytical capabilities for key measurements that were previously unattainable, and high pressure research provides IXS with numerous applications where the technique has unique advantages over other methods. High-pressure investigations can now be conducted using non-resonant IXS, resonant IXS, nuclear resonant IXS, and x-ray emission spectroscopy with energy resolutions of 100 meV to 1 eV for electronic transitions and 1 to 10 meV for phonon studies. By pressure-tuning materials over a wide range, we are able to investigate fundamental physics of electron gases, strongly correlated electron systems, high-energy electronic excitations, and phonons in energy and momentum space. The results will have a profound influence on materials applications as well as providing basic information for understanding the deep interior of the Earth and other planets.},
doi = {},
url = {https://www.osti.gov/biblio/782060},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Aug 28 00:00:00 EDT 2000},
month = {Mon Aug 28 00:00:00 EDT 2000}
}