U.S. Department of EnergyOffice of Scientific and Technical Information
SINGLE-PASS HIGH-GAIN FREE ELECTRON LASER ELECTRON BEAM DIAGNOSTICS.
Abstract
No abstract prepared.
- Authors:
- Publication Date:
- Research Org.:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Org.:
- USDOE Office of Energy Research (ER) (US)
- OSTI Identifier:
- 767159
- Report Number(s):
- BNL-67638; KA0403000
R&D Project: LS2; KA0403000; TRN: AH200037%%229
- DOE Contract Number:
- AC02-98CH10886
- Resource Type:
- Conference
- Resource Relation:
- Conference: BEAM INSTRUMENTATION WORKSHOP 2000, CAMBRIDGE, MA (US), 05/08/2000--05/12/2000; Other Information: PBD: 8 May 2000
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING; ELECTRON BEAMS; FREE ELECTRON LASERS; DIAGNOSTIC TECHNIQUES; BEAM DYNAMICS
Citation Formats
WANG, X J. SINGLE-PASS HIGH-GAIN FREE ELECTRON LASER ELECTRON BEAM DIAGNOSTICS.. United States: N. p., 2000.
Web.
WANG, X J. SINGLE-PASS HIGH-GAIN FREE ELECTRON LASER ELECTRON BEAM DIAGNOSTICS.. United States.
WANG, X J. 2000.
"SINGLE-PASS HIGH-GAIN FREE ELECTRON LASER ELECTRON BEAM DIAGNOSTICS.". United States. https://www.osti.gov/servlets/purl/767159.
@article{osti_767159,
title = {SINGLE-PASS HIGH-GAIN FREE ELECTRON LASER ELECTRON BEAM DIAGNOSTICS.},
author = {WANG, X J},
abstractNote = {No abstract prepared.},
doi = {},
url = {https://www.osti.gov/biblio/767159},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon May 08 00:00:00 EDT 2000},
month = {Mon May 08 00:00:00 EDT 2000}
}
Other availability
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