Submicron X-ray diffraction
Abstract
At the Advanced Light Source in Berkeley the authors have instrumented a beam line that is devoted exclusively to x-ray micro diffraction problems. By micro diffraction they mean those classes of problems in Physics and Materials Science that require x-ray beam sizes in the sub-micron range. The instrument is for instance, capable of probing a sub-micron size volume inside micron sized aluminum metal grains buried under a silicon dioxide insulating layer. The resulting Laue pattern is collected on a large area CCD detector and automatically indexed to yield the grain orientation and deviatoric (distortional) strain tensor of this sub-micron volume. A four-crystal monochromator is then inserted into the beam, which allows monochromatic light to illuminate the same part of the sample. Measurement of diffracted photon energy allows for the determination of d spacings. The combination of white and monochromatic beam measurements allow for the determination of the total strain/stress tensor (6 components) inside each sub-micron sized illuminated volume of the sample.
- Authors:
- Publication Date:
- Research Org.:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Org.:
- USDOE Director, Office of Science. Office of Basic Energy Studies. Division of Materials Sciences (US)
- OSTI Identifier:
- 764370
- Report Number(s):
- LBNL-45241
R&D Project: 458080; TRN: US0005000
- DOE Contract Number:
- AC03-76SF00098
- Resource Type:
- Conference
- Resource Relation:
- Conference: Synchrotron Radiation Instrumentation 2000, Berlin (DE), 08/21/2000--08/25/2000; Other Information: PBD: 17 Aug 2000
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 43 PARTICLE ACCELERATORS; ADVANCED LIGHT SOURCE; ALUMINIUM; BEAMS; GRAIN ORIENTATION; PHOTONS; STRAINS; SYNCHROTRON RADIATION; TENSORS; X-RAY DIFFRACTION; MICROANALYSIS; X-RAY MICRO-DIFFRACTION ELECTROMIGRATION FOCUSING
Citation Formats
MacDowell, Alastair, Celestre, Richard, Tamura, Nobumichi, Spolenak, Ralph, Valek, Bryan, Brown, Walter, Bravman, John, Padmore, Howard, Batterman, Boris, and Patel, Jamshed. Submicron X-ray diffraction. United States: N. p., 2000.
Web.
MacDowell, Alastair, Celestre, Richard, Tamura, Nobumichi, Spolenak, Ralph, Valek, Bryan, Brown, Walter, Bravman, John, Padmore, Howard, Batterman, Boris, & Patel, Jamshed. Submicron X-ray diffraction. United States.
MacDowell, Alastair, Celestre, Richard, Tamura, Nobumichi, Spolenak, Ralph, Valek, Bryan, Brown, Walter, Bravman, John, Padmore, Howard, Batterman, Boris, and Patel, Jamshed. 2000.
"Submicron X-ray diffraction". United States. https://www.osti.gov/servlets/purl/764370.
@article{osti_764370,
title = {Submicron X-ray diffraction},
author = {MacDowell, Alastair and Celestre, Richard and Tamura, Nobumichi and Spolenak, Ralph and Valek, Bryan and Brown, Walter and Bravman, John and Padmore, Howard and Batterman, Boris and Patel, Jamshed},
abstractNote = {At the Advanced Light Source in Berkeley the authors have instrumented a beam line that is devoted exclusively to x-ray micro diffraction problems. By micro diffraction they mean those classes of problems in Physics and Materials Science that require x-ray beam sizes in the sub-micron range. The instrument is for instance, capable of probing a sub-micron size volume inside micron sized aluminum metal grains buried under a silicon dioxide insulating layer. The resulting Laue pattern is collected on a large area CCD detector and automatically indexed to yield the grain orientation and deviatoric (distortional) strain tensor of this sub-micron volume. A four-crystal monochromator is then inserted into the beam, which allows monochromatic light to illuminate the same part of the sample. Measurement of diffracted photon energy allows for the determination of d spacings. The combination of white and monochromatic beam measurements allow for the determination of the total strain/stress tensor (6 components) inside each sub-micron sized illuminated volume of the sample.},
doi = {},
url = {https://www.osti.gov/biblio/764370},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Thu Aug 17 00:00:00 EDT 2000},
month = {Thu Aug 17 00:00:00 EDT 2000}
}