Structure within thin epoxy films revealed by solvent swelling: A neutron reflectivity study

Conference · Thu Mar 02 00:00:00 EST 2000

OSTI ID:752534

KENT, MICHAEL S; YIM, HYUN; MCNAMARA, WILLIAM FRERE; IVKOV, R; SATIJA, S; MAJEWSKI, J

The focus of this work is the structure within highly crosslinked, two component epoxy films. The authors examine variations in crosslink density within thin epoxy films on silicon substrates by solvent swelling. The method is based on the fact that the equilibrium volume fraction of a swelling solvent is strongly dependent upon the local crosslink density. The authors examine the volume fraction profile of the good solvent nitrobenzene through the epoxy films by neutron reflection. Isotopic substitution is used to provide contrast between the epoxy matrix and the swelling solvent.

• Research Organization: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Sandia National Lab. (SNL-CA), Livermore, CA (United States)
• Sponsoring Organization: US Department of Energy (US)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 752534
• Report Number(s): SAND2000-0557C; TRN: AH200018%%83
• Resource Relation: Conference: 23rd Annual Meeting of the Adhesion Society, Myrtle Beach, SC (US), 02/19/2000--02/23/2000; Other Information: PBD: 2 Mar 2000
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
EPOXIDES
THIN FILMS
CROSS-LINKING
INTERFACES
MICROSTRUCTURE
SOLVENT PROPERTIES
NITROBENZENE