(Ba,Sr)TiO{sub 3} dielectrics: Relationship between bulk and thin film properties
Conference
·
OSTI ID:751843
Thin films of complex perovskites have a number of potentially important applications. Of major scientific and practical concern is the scaling of properties as film dimensions are reduced. This paper describes a satisfactory relationship between bulk and thin film dielectric properties of (Ba,Sr)TiO{sub 3}. Relative contributions of strain, A:B cation stoichiometry, and interface are separated to explain temperature dependent dielectric behavior.
- Research Organization:
- Argonne National Lab., IL (US)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 751843
- Report Number(s):
- ANL/MSD/CP-99652; TRN: AH200018%%377
- Resource Relation:
- Conference: US-Japan Seminar on Dielectric and Piezoelectric Ceramics, Okinawa (JP), 11/03/1999--11/05/1999; Other Information: PBD: 22 Dec 1999
- Country of Publication:
- United States
- Language:
- English
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