Intrinsic efficiency of germanium: a basis for calculating expected detector efficiency

Conference · Thu Jan 01 00:00:00 EST 1976

OSTI ID:7230507

Strauss, M G; Sherman, I S; Cattelino, M J; Brenner, R; Pehl, R H

A method is presented whereby the intrinsic efficiency of Ge is utilized to calculate the expected peak efficiency of detectors having a wide range of sizes. The intrinsic efficiency of Ge, which is the probability for total absorption, was measured at 122 and 136 keV in Ge(Li) coaxial detectors and HPGe planar detectors having an effective thickness ranging from 5 to 50 mm. At 136 keV it is 64% for a thickness of 10 mm and 82% for 20 mm, after which it levels off reaching 89% at 50 mm. It is shown that the peak efficiency of a detector is a product of only the intrinsic efficiency and the solid angle, once losses due to edge escape and detector imperfections (surface channels and high dislocation densities) are determined. The absolute and relative (to NaI(Tl)) peak efficiency of a sample detector, calculated on the basis of intrinsic efficiency, are in good agreement with measured values. This method should find applications in the design of new detector systems particularly those for diagnostic imaging with /sup 99/Tc (140 keV).

• Research Organization: Argonne National Lab., IL (USA)
• DOE Contract Number: W-31-109-ENG-38
• OSTI ID: 7230507
• Report Number(s): CONF-761006-37; TRN: 77-006572
• Resource Relation: Conference: Nuclear science, scintillation and semiconductor counter symposium, New Orleans, LA, USA, 20 Oct 1976
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
GAMMA SPECTROMETERS
EFFICIENCY
HIGH-PURITY GE DETECTORS
LI-DRIFTED GE DETECTORS
DATA
THICKNESS
DIMENSIONS
GE SEMICONDUCTOR DETECTORS
INFORMATION
LI-DRIFTED DETECTORS
MEASURING INSTRUMENTS
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS
SPECTROMETERS
440103* - Radiation Instrumentation- Nuclear Spectroscopic Instrumentation